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310-876 exam Dumps Source : Level 2 field Engineer Examination

Test Code : 310-876
Test designation : Level 2 field Engineer Examination
Vendor designation : SUN
: 140 actual Questions

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field office: 'Goosebumps 2' Earns strong $16M Weekend, 'dangerous instances on the El Royale' Bombs | killexams.com actual Questions and Pass4sure dumps

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  • The subsequent wide liberate beginner is Sony Animation and Columbia’s Goosebumps 2: Haunted Halloween. The sequel to the greater-than-anticipated pint-sized horror flick began its dash with a decent $sixteen.2 million Fri-sun debut. That’s without doubt 31% under the $23.8m Fri-solar launch of the initial offering. This isn’t a surprise, as Sony spent much less ($35m versus $58m) and didn’t scrutinize forward to Jack Black to develop into accessible for yet another starring jaunt. i'd occupy waited for Black, however c’est la vie. nonetheless, the sequel cost 39% much less its predecessor so a 31% smaller opening weekend it’s a catastrophe.

    I haven’t considered the film yet, as a result of my children are lame and my wife in reality needs to scrutinize it (oh, ferocious irony), however it’s basically being sold as a cheaper (and frequently Jack Black-free) redo of the primary movie. To exist fair, lower back in the day, most sequels occupy been nearly nearer in spirit to home on my own 2: rupture out From long island as hostile to The Empire Strikes lower back. Black himself just opened Eli Roth’s pleasant The residence with a Clock in Its partitions, which didn’t support when it comes to comparisons. nevertheless, Sony is hoping for Halloween legs.

    The movie pulled a promising three.375x weekend multiplier, in comparison to the primary film’s three.26x multiplier. The best kiddie competitors is (sarcastically) Sony’s PG-13 Venom. The Goosebumps books occupy a following (R.L. Stine has sold four hundred million copies of them), and this could exist a prelude before the sequel that fanatics definitely wish to see, exceptionally at some point at Horrorland. If it doesn’t hold on previous the weekend, it’ll exist a case of A) no longer giving the lovers what they desired and B) making a Goosebumps film that became most efficient appealing to folks who were primarily interested in a Goosebumps film.

    20th Century Fox opened Drew Goddard’s usual comedic thriller unhealthy instances on the El Royale this weekend The movie has earned decent reviews, however changed into at impeccable times going to occupy quandary breaking out even with an all-star forged (Jeff Bridges, Cynthia Erivo, Dakota Johnson, Jon Hamm and Chris Hemsworth). Such is actuality for an outright customary geared toward adults in an IP-driven Hollywood. The film earned just $7.2 million over its opening weekend. That’s now not extremely agreeable for a $30m-budgeted common. With the grown-americaseeing a star Is Born, Venom or First Man, there wasn’t anyone left for the other adult movie.

    The huge platform debut of the weekend turned into Amazon's attractive Boy. The acclaimed and Oscar-pleasant drama about a father coping with his son's drug addiction has earned plaudits for Steve Carrell and Timothée Chalamet, and it simply racked up a major constrained debut. The $25 million-budgeted film earned $225,000 this weekend in exactly four theaters, for a scorching $55.8k per-theater regular. Now they will perceive if it could retain that degree of pastime because it expands, as it's naturally no longer a "Saturday nighttime on the films" variety of title. however's actually off to an excellent delivery which continues it within the Oscar pool.

    I've studied the film industry, each academically and informally, and with an stress in field workplace analysis, for 28 years. I occupy considerably written about impeccable of stated subjects for the ultimate ten years. My shops for film criticism, field office commentary, and movie-skewing s...

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    Survey finds a majority of sun Prairie residents would embolden referendum | killexams.com actual Questions and Pass4sure dumps

    via NBC15 group of workers | 

    Posted: Thu 11:15 PM, Oct 04, 2018

    solar PRAIRIE, Wis. (WMTV) -- solar Prairie survey outcomes suggests a majority of residents assist a feasible referendum on the 2019 April ballot.

    The survey turned into carried out in September. greater than 17,000 families within the sun Prairie enviornment college District (SPASD) occupy been asked if they would aid three distinctive components: build a brand original lofty college, consolidate impeccable middle schools, and renovate or construct athletic fields.

    sixty seven% of respondents would support pile a brand original lofty school and seventy three% would support a referendum to reconfigure the hub colleges.

    those who replied to the survey additionally weighed in on even if SPASD may still invest in rebuilding Ashley field or build a stadium with a multi-use field at every unreasonable faculty. Ashley box is at the instant the main athletic field for football, lacrosse, and Grade 9 baseball.

    30% supported rebuilding Ashley container, 33% supported a stadium at each lofty faculties, and 14% dud no longer embolden both alternative.

    based on the entire alternatives available, the Secondary faculty house Planning Committee identified two alternatives for funding.

    choice 1:build a 2d unreasonable school for $140.4 millionReconfigure middle faculties to serve grades 6-eight for $16.2 millionRebuild Ashley box for $17.four millionTotal= $174 million

    alternative 2:construct a 2d lofty faculty for $one hundred forty.four millionReconfigure core faculties to serve grades 6-8 for $sixteen.2 millionBuild athletic/multi-use stadium at both unreasonable faculties for $29.7 millionTotal= $186.three million

    in keeping with the survey consequences, 55% of impeccable residents steer alternative 1. It has an estimated annual tax enlarge of $74 ($6.17 per thirty days) for each $100,000 of property expense over the 2018-19 tax levy.

    The survey too discovered fifty one% of impeccable residents assist preference 2. It has an estimated annual tax enlarge of $80 ($6.sixty six per thirty days) for each and every $100,000 of property value over the 2018-19 tax levy.

    A majority of residents additionally pointed out they might assist an operational referendum to fund every day costs at a 2nd unreasonable college. that would occupy an estimated annual tax boost of $seventy three ($6.08 per thirty days) for each and every $100,000 of property value.

    SPASD obtained four,024 survey responses. The participation fee became 23% and the margin of error was +/- 1.5%


    Nevada lawmakers deserve to embolden smooth taking fragment in box for state’s public colleges | killexams.com actual Questions and Pass4sure dumps

    Now that the 2018-19 college 12 months is in plenary swing, it appears enjoy an seasonable time to existing a quiz. Don’t exist anxious, there’s only one question, and the reply is essential.

    The query is, which of the following schools may still receive a bigger share of funding for guideline?

    Is it faculty A, which has a unreasonable percent of students from core-class or filthy wealthy households the state English is the simple language? Or is it college B, the state the overwhelming majority of students are from low-salary households and are English language newcomers?

    The admit is school B, of course, for the basic rationale that there’s a stronger degree of rigor in instructing these college students than their greater prosperous peers in college A.

    but in Clark County, the funding circumstance is absolutely upside-down. As special in a report released this summer time with the aid of the state fork of education, no longer handiest are colleges in low-profits areas getting a smaller portion of funding for instruction, they’re subsidizing faculties in wealthier components of the group.

    here's no option to enhance scholar achievement standard in Southern Nevada, which is why the report should exist required reading for Nevada lawmakers as they prepare for the 2019 legislative session. It suggests in black and white why fixes are vital in the manner state funding is being allocated in the Clark County faculty District.

    At problem is the style budgeting is being carried out for CCSD’s 350-plus colleges, in particular using generic instructor salaries in deciding upon the quantity of funding for each and every school.

    CCSD’s existing formula is to earmark the variety of faculty positions at colleges in line with such factors as class size ratios and enrollment initiatives, then build budgets in response to regular trainer salaries.

    but that’s the state issues fade awry. That’s as a result of lecturers at colleges in more prosperous areas generally develop bigger salaries than their peers in lessen-income areas, the state faculties tend to occupy more group of workers turnover and bring in teachers who are noticeably original to the profession. Fewer years of adventure equal much less revenue universal. The cycle feeds itself, as a result of lecturers at decrease-profits schools are inclined to are seeking for positions in greater-salary colleges after getting a pair of years adventure.

    under the existing structure, schools with tremendous populations of English language beginners and low-salary families often near in beneath budget but aren’t allowed to maintain their discount rates. as a substitute, that funding is used to offset the bigger standard salaries in other colleges and retain the district’s funds even.

    The effect: students in decrease-earnings areas are getting a less-than-equal share of state funding regardless of having improved wants than their friends.

    “CCSD’s present local faculty precinct budget allocation model is essentially inequitable,” concludes the file, issued in July by using the state department of education.

    Analysts additionally discovered that the budgeting formulation effects in underfunding of fundamental schools in comparison to core and lofty schools, and stated that youngsters there is some weighted funding in the components — for pastoral colleges, magnet schools and 1- and a pair of-big designation schools — there’s no such funding for poverty and restrained English proficiency.

    Reform proponents disclose the district may still undertake an specific-salary budgeting formulation, which would finish the subsidization problem, while additionally tweaking the state funding system by way of including weighted funding for low-profits and non-English-speaking college students.

    these things should ensue, but on the equal time it might exist crucial to not to unfairly disadvantage faculties that stand to lose money amid the changes. in requisite of further spending on state colleges, funding could exist shifted far from some colleges that are actually on the winning finish of the equation, including pastoral faculties and magnet faculties. some of those colleges may exist forced to close, the report pointed out.

    The file’s authors advised that lawmakers bounce in by means of adopting “technical edits” to the legislation that reorganized the district efficient final year. moreover, the analysts called for CCSD officers to work with principals, teachers and oldsters to craft an implementation purpose that could restrict disruptions in the gadget whereas nevertheless reforming the funding method.

    In a recent visit to the solar, first-year CCSD Superintendent Jesus Jara stated the want for adjustments in the funding structure and stated that removing inequities between low- and better-revenue college students can exist amongst his agreeable priorities.

    That was encouraging to listen to. Now, Nevada lawmakers should consume fragment and prepare to embolden degree the taking fragment in box.


    310-876 smooth 2 field Engineer Examination

    Study steer Prepared by Killexams.com SUN Dumps Experts


    Killexams.com 310-876 Dumps and actual Questions

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    310-876 exam Dumps Source : Level 2 field Engineer Examination

    Test Code : 310-876
    Test designation : Level 2 field Engineer Examination
    Vendor designation : SUN
    : 140 actual Questions

    Right state to find 310-876 Latest dumps paper.
    I am Aggarwal and i work for ingenious Corp. I had accomplished to emerge for the 310-876 examination and changed into very nervous approximately it as it contained difficult case research and many others. I then applied to your query pecuniary institution. My many doubts got cleared due to the explainations supplied for the answers. I moreover got the case research in my electronic mail which had been properly solved. I regarded for the exam and am gay to mention that I got 73.75% and that i near up with the whole credit. Further I congratulate you and appearance similarly to immaculate more assessments with the embolden of your website online.


    fantastic source of tremendous latest dumps, accurate solutions.
    I moreover had a splendid revel in with this training set, which led me to passing the 310-876 exam with over ninety eight%. The questions are actual and valid, and the checking out engine is a tremendous/guidance device, despite the fact that youre no longer planning on taking the examination and sincerely want to expand your horizons and enlarge your knowledge. Ive given mine to a pal, who too works on this state but clearly received her CCNA. What I imply is its a splendid reading device for absolutely everyone. And if you purpose to consume the 310-876 exam, this is a stairway to achievement :)


    It is really noteworthy suffer to occupy 310-876 actual exam questions.
    Hats down the excellent 310-876 exam training choice. I surpassed my 310-876 exam closing week, and this set of exam questions and solutions has been very beneficial. Those objects from killexams.Com is actual. Before creating a buy, I contacted customer service with questions on how updated their substances are, and they showed that they update impeccable checks on nearly each day foundation. They add updates in which essential, or truly double consume a scrutinize at the content material to develop sure its up to date. It justifies shopping for an exam mind sell off. With killexams.com, I recognize that i will depend on the modern exam materials, not a few e engage that may emerge as out of date every week after its posted. So I anticipate that is the trait examination guidance choice. I assume i am capable of develop bigger my certification portfolio into some one of a kindhearted providers, Im simply no longer wonderful which ones but. However what Im certain approximately is that I can exist the Use of killexams.Com as my essential schooling useful resource.


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    can you believe, impeccable 310-876 questions I organized occupy been asked.
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    No time to consume a scrutinize at books! requisite some thing speedy preparing.
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    310-876 exam prep got to exist this easy.
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    Shortest questions that works in actual test environment.
    I moreover applied a blended bag of books, additionally the years of useful revel in. yet, this prep unit has ended up being especially treasured; the inquiries are certainly what you spot at the exam. extremely accommodating to exist sure. I handed this exam with 89% marks around a month again. Whoever lets you know that 310-876 is significantly difficult, receive them! The examination is to develop sure relatively hard, thats legitimate for just about impeccable other assessments. killexams.com and examination Simulator changed into my sole wellspring of records whilst fetch prepared for this exam.


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    Narmada Control Authority recruitment for Junior Engineer posts; Check eligibility, pay and other details at ssconline.nic.in | killexams.com actual questions and Pass4sure dumps

    Narmada Control Authority (NCA) has invited applications for the recruitment of six posts of Junior Engineer in civil and electrical disciplines for its offices located at Indore, Bhopal and Vadodara. Selection to these posts will exist through the Junior Engineer examination 2018, which will exist conducted by Staff Selection Commission (SSC).

    a proximate up of a logo © image

    The eligible and interested candidates can apply for the post in the prescribed format from January 1, 2019 to February 15, 2019. The notification of the SSC JE 2018 examination is likely to exist released on December 15. Candidates can visit the Commission's website at https://ssconline.nic.in for the latest information about the examination.

    Narmada Control Authority recruitment details-

    Important dates:

    Starting date of online application - 01 January 2019

    Last date of online application - 15 February 2019

    Posts:

    1) Junior Engineer (Civil) - 04

    2) Junior Engineer (Electrical) - 02

    Educational Qualification: The candidate should possess valid SSC JE 2018 2018 exam score in the respective discipline at the time of applying online on NCA website at nca.gov.in.

    Selection Procedure: The candidates will exist shortlisted for document verification based on the sum of tier-l and tier-ll results of SSC JE Exam, 2018.

    Pay Scale: Level-6 (35400-112400) as per the Seventh Pay Commission


    Polymer Science and Engineering - How and Where AFM is Applicable | killexams.com actual questions and Pass4sure dumps

    The atomic compel microscope is a sophisticated instrument which helps delineate the characteristics of polymers by revealing physical properties and mechanical behavior at nanoscale, as well as providing images. This article discusses the advanced features and benefits of Asylum Research CypherTM and MFP-3DTM AFMs in this field.

    Polymers are useful in a host of applications. Their properties can exist tuned and may exist customized to suit different uses. Moreover, they are often less costly, sturdier and more environmentally friendly than other materials. In order to yield and bring into Use a original polymer, the structure, processing, characteristics and performance must impeccable exist understood. This is achievable at micro- or molecular smooth if the data acquired is of this resolution.

    Figure 1 shows AFM usage in analyzing the basic principles underlying polymers, while design 2 shows its employment in engineering a particular solution of a polymer. The point is that AFM plays a vital role in assessing polymers at these small length scales [1-4]. The lofty spatial resolution brings polymer morphology into view at resolutions below micrometers or even nanometers. However, much more data can exist obtained using AFMs, such as molecular forces, mechanical, thermal and electrical mapping, and finding the effects of heat or solvents in realistic situations.

    Morphology of PS-PEP diblock copolymer film – Tapping mode angle image of a polystyrene-block-poly(ethylenealt-propylene) (PS-PEP) film on a silicon wafer. The darker region on the left side with lower angle corresponds to the lofty side of a 16 nm step in the wafer. In this region and the darker curved region on the right, the film forms a PS wetting layer. In the lighter region with higher phase, the film contains a single layer of spherical PEP microdomains. Several vertical rows of aligned microdomains are seen on the low side of the step. Diblock copolymers can self assemble into knotty fitful structures, a property that has attracted interest for their Use as templates in nanolithography. Understanding how film thickness and step height move domain location and orientation aids in developing obstruct copolymer templates. Imaged with the MFP-3D AFM; scan width 2 μm, Z (phase) scale 10°. Adapted from Ref. 5.

    Figure 1: Morphology of PS-PEP diblock copolymer film – Tapping mode angle image of a polystyrene-block-poly(ethylenealt-propylene) (PS-PEP) film on a silicon wafer. The darker region on the left side with lower angle corresponds to the lofty side of a 16 nm step in the wafer. In this region and the darker curved region on the right, the film forms a PS wetting layer. In the lighter region with higher phase, the film contains a single layer of spherical PEP microdomains. Several vertical rows of aligned microdomains are seen on the low side of the step. Diblock copolymers can self assemble into knotty fitful structures, a property that has attracted interest for their Use as templates in nanolithography. Understanding how film thickness and step height move domain location and orientation aids in developing obstruct copolymer templates. Imaged with the MFP-3D AFM; scan width 2 μm, Z (phase) scale 10°. Adapted from Ref. 5.

    Distribution of components in EVA-EPP-carbon black blends – Images of tapping mode topography (left) and angle (right) of semiconducting polymer blends. The blends contained two polyolefin copolymers, poly(ethylene vinyl acetate) (EVA) and ethylene-propylene copolymer (EPP), mixed with carbon black (CB). The images correspond to blends with 10 wt % (top) and 30 wt % (bottom) EPP. Carbon black is an economical filler used in many practical applications to create electrically conducting polymers. However, addition of CB can significantly move blend qualities such as viscosity. The Use of two copolymers achieved a balance between performance (electrical volume resistivity) and processing (melt tide rate). The angle images clearly differentiate individual blend components, allowing the effect of component distribution on conductivity to exist studied. Imaged with the MFP-3D AFM, scan size 20 μm. For more information perceive Ref. 6.

    Figure 2: Distribution of components in EVA-EPP-carbon black blends – Images of tapping mode topography (left) and angle (right) of semiconducting polymer blends. The blends contained two polyolefin copolymers, poly(ethylene vinyl acetate) (EVA) and ethylene-propylene copolymer (EPP), mixed with carbon black (CB). The images correspond to blends with 10 wt % (top) and 30 wt % (bottom) EPP. Carbon black is an economical filler used in many practical applications to create electrically conducting polymers. However, addition of CB can significantly move blend qualities such as viscosity. The Use of two copolymers achieved a balance between performance (electrical volume resistivity) and processing (melt tide rate). The angle images clearly differentiate individual blend components, allowing the effect of component distribution on conductivity to exist studied. Imaged with the MFP-3D AFM, scan size 20 μm. For more information perceive Ref. 6.

    Investigating Morphology and Structure

    Polymer structures change at different scales of length. These smaller scale structures involve a brush configuration, and if single molecules are visualized, chain packing; for crystalline polymers, lamellar formations; and with obstruct or graft copolymers, microphase separation. Features visible on larger scales involve pores or fillers, and for blends of polymers, interfacial phases. Effects of processing enjoy etching, heat or strain are too visible on the surface roughness or finish. The study of nanoparticles, nanofibers and nanodevices made of polymer includes statistical analysis of both individual components and the whole assembly’s shape and size.

    The AFM allows the structure to exist visualized via nanoscale topography of the surface, typically in tapping mode. This mode yields images with excellent spatial resolution, up to molecular and atomic structure, as design 3 reveals. The small area in contact between the tip and the sample is responsible for the lofty resolution. This in turn is achieved by using ultrasharp tipped probes, in addition to the tapping mode which results in very gentle sideways and vertical forces between the tip and the sample.

    As design 4 shows, AFM imaging has recently become much faster with the emergence of newer AFMs, such as the Cypher AFMs from Asylum Research. This is due to the Use of small cantilevers. Not only achieve smaller cantilevers occupy higher resonant frequencies, they are too able to provide improved resolution and control for very small forces in the subpiconewton range, which is extremely crucial when investigating polymers which are elegant and easily undergo deformation.

    Molecular and crystalline structure of rubrene – Tapping mode topography images of crystalline rubrene imaged with the Cypher S AFM. Rubrene is a polycyclic aromatic hydrocarbon used as an organic semiconductor in organic light emitting diodes. The main color image with scan size 5 μm shows single steps of the crystalline lattice. The inset black-and-white image reveals molecular-level structure, highlighting the superb spatial resolution of Cypher AFMs, even in air. Scan size 20 nm. Sample courtesy of Rutgers University.

    Figure 3: Molecular and crystalline structure of rubrene – Tapping mode topography images of crystalline rubrene imaged with the Cypher S AFM. Rubrene is a polycyclic aromatic hydrocarbon used as an organic semiconductor in organic light emitting diodes. The main color image with scan size 5 μm shows single steps of the crystalline lattice. The inset black-and-white image reveals molecular-level structure, highlighting the superb spatial resolution of Cypher AFMs, even in air. Scan size 20 nm. Sample courtesy of Rutgers University.

    PHB/V spherulite crystallization – Tapping mode angle images of a polyhydroxybutyrate-co-valerate (PHB/V) spherulite crystallizing at leeway temperature over a age of three minutes. Scan size 1.5 μm. The scan rate of 40 Hz, or approximately 10 seconds per frame, allows transparent visualization of the crystallization process. Imaged with the Cypher AFM. Sample courtesy of the University of Sheffield.

    Figure 4: PHB/V spherulite crystallization – Tapping mode angle images of a polyhydroxybutyrate-co-valerate (PHB/V) spherulite crystallizing at leeway temperature over a age of three minutes. Scan size 1.5 μm. The scan rate of 40 Hz, or approximately 10 seconds per frame, allows transparent visualization of the crystallization process. Imaged with the Cypher AFM. Sample courtesy of the University of Sheffield.

    Using Asylum AFMs for Topographic Imaging
  • All Asylum AFMs Use closed-loop scanning which has the edge of repeatable and precise scanning motions due to the Use of position sensors. As a result, image distortions are avoided, with very precise offsets, while specific scan areas are zoomed in to. The Cypher 5 and ES, as well as the MFP-3D InfinityTM impeccable occupy the most advanced sensors with remarkably low noise, down to 35 pm and 60 pm in the Z, and X and Y, axes respectively.
  • The Cypher family AFMs Use small cantilevers of less than 10 microns length, so that imaging goes faster, and standard line scan rates are up to 10-40 Hz. These too occupy better resolution and lower noise, and thus the DNA helix and single point atomic defects are now imaged on a routine basis.
  • GetStartedTM is integrated with the MFP-3D Infinity and impeccable Cypher AFMs to automate image parameters. Even before the first tip-sample contact, the parameters are defined automatically using a predictive algorithm. This protects both sample and tip against wear due to non-optimal contact, and too ensures the acquisition of excellent data starting from scan line 1.
  • Measuring Forces and Deformation

    The cantilever used in AFMs is one which is built with extreme compel sensitivity, which makes it model for the measurement of a compass of compel magnitudes from piconewtons to micronewtons. This contains most polymer interactions too. There are two common ways to measure force: either single molecules are pulled to resolve the forces at molecular level, or polymeric materials are indented to evaluate their elastic and viscoelastic recrudesce following deformation.

    When the single molecule approach is used, one molecule is stretched between the tip of the AFM and the sample surface, and the deflection of the cantilever is measured. Once the spring constant and deflection sensitivity of the cantilever is known, a compel vs. distance plot is generated. These compel curves provide information about intramolecular forces, enjoy the elasticity of the single chain, or conformational transitions, as well as intermolecular forces, including interactions between polymer and solvent, and surface adhesion and desorption.

    These forces thus act inside or between the molecules. One case of compel spectroscopy measurement is shown in design 5, using poly-L-lysine molecules during their desorption from a hydrophobic surface.

    The other way uses measurements of the deflection produced in the cantilever as the AFM tip indents the sample. Conventionally used cantilevers apply a compel that is lofty enough to reason deformation in the polymers which occupy modulus ranging from kPa to a few GPa. When a model is used to examine the indentation of the sample by the tip, data is generated on the elastic and viscoelastic characteristics of the sample at nanoscale.

    Asylum AFMs for Measuring Force
  • GetRealTM is integrated into impeccable Asylum AFMs, being a software to calibrate the cantilever spring constant and deflection sensitivity automatically at one click, without having to touch the surface of the sample.
  • All Asylum AFMs occupy compel measurements which are thermally limited and Use Z sensors for low noise. This allows measurement of both axes of the compel curves with as much sensitivity and accuracy as possible.
  • All Asylum AFMs are programmed to resolve compel curves with sophisticated features. Several pre-set indentation models are available, such as Hertz/Sneddon, Johnson-Kendall-Roberts (JKR), Derjaguin-Müller-Toporov (DMT), and Oliver-Pharr. In addition there is a steer to model selection which shows the plasticity index, the ratio of compel to adhesion, and Tabor coefficient calculation.  
  • Mapping Nanomechanical Properties

    Polymers must occupy certain mechanical attributes to suit their varied applications, such as food packaging to resilient electronic devices. Sometimes one or more components with angle separation, or a filler, could exist added to enhance the mechanical performance. In most cases they are at nanoscale and thus their mechanical properties must exist measured at this spatial resolution.

    Asylum has multiple techniques for nanomechanical studies, from simple methods of quantitation to advanced quantitative techniques. In many situations the two are used to complement each other in a way that informs the observer about the polymer sample.

    The introduction of the tapping mode for angle imaging created much interest in the late nineties. This has led to the emergence of angle imaging as a very useful tool for characterizing polymers, since it can resolve the fine structure of the molecule and distinguish various components of the material.

    Sometimes interpretation of the results becomes difficult because of the influence of the mode of storage and dissipation of elastic energy and viscous energy by the material, respectively, (the loss tangent) in addition to other forces that reason dissipation. Yet angle imaging is still a relatively facile and widespread way of acquiring qualitative data on material properties.

    Another way to obtain a qualitative map of material property changes is the Use of bimodal imaging or Dual ACTM which is similar to the tapping mode with angle imaging at bottom, with the incompatibility being the driving of an additional cantilever mode along with the first mode. Topography and angle measurements from the first mode are taken along with amplitude and angle response measurements from the second mode. Again, the interpretation is sometimes complicated, but its Use remains valid for acquiring contrast where this is not feasible by angle imaging.

    The Asylum NanomechProTM Toolkit lists many methods, among which the unique AM-FM Viscoelastic Mapping Mode is model for polymers. enjoy bimodal imaging, this technique makes Use of tapping mode to operate at two cantilever mode frequencies at the selfsame time. The second mode is tracked for its frequency and correlated with the stiffness of the sample.

    The first mode is related to the loss tangent of the sample through its angle and amplitude. The net result is transparent quantitative mapping of the elastic storage modulus and the viscoelastic loss modulus, or loss tangent, but with the rapidity expected with the tapping mode and with sample preservation. The large compass of applications feasible with the AM-FM mode, making it feasible to test almost any polymer, is because of the impressive breadth of its measurement compass from under 1 MPa to over 100 GPa. One instance where AM-FM mode is used to map a polymer assembled from multiple components is shown in design 6.

    Single molecule forces for poly-L-lysine homopolymer – (top) realistic of compel spectroscopy concepts. A single polymer molecule is covalently attached to the AFM tip by a linker (here, polyethylene glycol, PEG). (bottom) Force-distance curve for poly-L-lysine on a hydrophobic self-assembled monolayer (SAM) in water. The compel plateau indicates the desorption of a single polymer from the surface. Histograms obtained from multiple compel curves provide the average desorption compel (inset, top) and detachment length (inset, bottom) Acquired with the MFP-3D AFM. Adapted from Ref. 7.

    Figure 5: Single molecule forces for poly-L-lysine homopolymer – (top) realistic of compel spectroscopy concepts. A single polymer molecule is covalently attached to the AFM tip by a linker (here, polyethylene glycol, PEG). (bottom) Force-distance curve for poly-L-lysine on a hydrophobic self-assembled monolayer (SAM) in water. The compel plateau indicates the desorption of a single polymer from the surface. Histograms obtained from multiple compel curves provide the average desorption compel (inset, top) and detachment length (inset, bottom) Acquired with the MFP-3D AFM. Adapted from Ref. 7.

    Mechanical mapping of a bonded polymer interface – AM-FM Viscoelastic Mapping Mode images and histograms of (left) loss tangent and (right) second mode frequency overlaid on topography for a rubber-epoxy-latex sandwich. Imaged with the Cypher S AFM; scan size 5 μm. Different sample components are clearly distinguished by the AM loss tangent of viscoelastic damping. They are too resolved by the FM frequency, which is proportional to elastic stiffness, despite very similar modulus values for latex (~40 MPa) and rubber (~43 MPa).

    Figure 6: Mechanical mapping of a bonded polymer interface – AM-FM Viscoelastic Mapping Mode images and histograms of (left) loss tangent and (right) second mode frequency overlaid on topography for a rubber-epoxy-latex sandwich. Imaged with the Cypher S AFM; scan size 5 μm. Different sample components are clearly distinguished by the AM loss tangent of viscoelastic damping. They are too resolved by the FM frequency, which is proportional to elastic stiffness, despite very similar modulus values for latex (~40 MPa) and rubber (~43 MPa).

    Modulus mapping of PS-PCL blend – Elastic modulus overlaid on topography for a polystyrene (PS)-polycaprolactone (PCL) blend. Imaged with rapid compel Mapping Mode on the MFP-3D Infinity AFM; scan size 4 μm. The 1024x1024 image size would exist impractically leisurely to obtain with conventional compel volume techniques. It provides superb lateral resolution, resolving features as small as approximately 10 nm. As expected from bulk literature values, PS regions (yellow)have higher modulus (approximately 3 GPa) than PCL regions (purple, approximately 350 MPa). The biodegradable nature of polycaprolactone is valuable in progress of original bioblend materials.

    Figure 7: Modulus mapping of PS-PCL blend – Elastic modulus overlaid on topography for a polystyrene (PS)-polycaprolactone (PCL) blend. Imaged with rapid compel Mapping Mode on the MFP-3D Infinity AFM; scan size 4 μm. The 1024x1024 image size would exist impractically leisurely to obtain with conventional compel volume techniques. It provides superb lateral resolution, resolving features as small as approximately 10 nm. As expected from bulk literature values, PS regions (yellow)have higher modulus (approximately 3 GPa) than PCL regions (purple, approximately 350 MPa). The biodegradable nature of polycaprolactone is valuable in progress of original bioblend materials.

    Force curves are one established way of elastic modulus measurement. It is suitable for when point measurements are in view, but mapping using this technique is so leisurely as to exist non-feasible. Typically, a 256x256 pixel array is acquired in more than 18 hours, at 1 second per pixel.

    This issue is resolved by the rapid compel Mapping Mode from Asylum, integrated into the MFP-3D Infinity AFM, which has compel curve acquisition rates of up to 300 Hz, thus taking below 10 minutes to acquire a 256x256 pixel image of complete deflection vs Z sensor compel curves. At this speed there are still no curves establish missing nor is there any invisible manipulation of the data. design 7 shows how rapid compel Mapping is carried out on a phase-separated polymer blend.

    Another special way pioneered by Asylum is the Contact Resonance Viscoelastic Mapping Mode, used to measure elastic storage modulus as well as viscoelastic loss modulus on polymers with relatively lofty stiffness, modulus of 1 GPa or more.

    This mode takes edge of the lofty sensitivity of the cantilever resonance to any small variations in the mechanical characteristics of the sample after bringing the tip in contact. In common with impeccable these above-mentioned techniques, Contact Resonance can exist used either for rapid qualitative mapping, employing the least feasible calibration, or for accurate quantitative results after calibrating against a material whose properties are known.

    Asylum AFMs for Mapping Nanomechanical Properties
  • Many techniques are described in the Asylum NanomechPro Toolkit in order to embolden select the best technique for each application, thus comparing the results obtained using several different techniques.
  • Both AM-FM and Contact Resonance modes assess the viscoelastic response of the sample, that is, the loss modulus or the loss tangent. They too scrutinize at its storage modulus or elastic response. This is essential to know in a variety of situations which require repercussion resistance or toughness, which are heavily affected by the material’s viscous properties.
  • The Cypher AFM family uses small cantilevers with the AM-FM Viscoelastic Mapping Mode to fulfill quantitative mapping of the nanomechanical properties of the sample much quicker than is feasible using any other method.
  • The NanoRackTM Stretch Stage is brought into Use in some situations requiring the measurement of materials which are under tensile strain, with the MFP-3D AFM series.
  • Measuring Thermal Properties

    Many polymers intricate very significant changes in properties as the temperature increases. It is essential to understand glass transition temperatures and similar characteristics in order to gain a deeper insight into molecular motion. This would enable the evaluation of properties which are critical to their performance such as toughness and repercussion resistance, and to understand how they are affected by processing or by lofty temperatures in their operating surroundings.

    When AFM measurements are taken at varying temperatures, they provide data on many processes enjoy crystallization, melting, glass transitions and sub-glass transitions. The Use of sample heating stages ensures that temperatures can exist varied with strict control over the compass to exist studied for polymer transitions. design 8 illustrates how modulus in polyethylene terephthalate varies with temperature, this being a thermoplastic material. design 9 reveals the changes in morphology of a microparticle with shape remembrance as it undergoes heating.

    In addition to assessing the changes in form and properties in relation to the temperature, there are too ways to directly resolve heat properties at nanoscale. One is scanning thermal microscopy (SThM), which uses a custom cantilever specially designed to develop contact with the sample while monitoring the changes in temperature caused by a local heat source. As it measures the local surface temperature of the sample, image contrast is produced in direct relation to the local conductivity to thermal energy. design 10 shows an specimen of SThM used to image a polymer blend.

    Another thermal imaging way is local thermal analysis (LTA), which uses a probe that is heated locally rather than a local sample surface temperature sensor, to heat a nanoscale volume of the sample. With heating or cooling of the sample, there is expansion or contraction in keeping with its local coefficient of thermal expansion. The cantilever deflection reflects this change, generating deflection-temperature curves.

    These curves are extremely sensitive when it comes to detecting the rise of a thermal transition in the sample, and can thus differentiate various materials by detecting their melting or glass transition temperatures. The Use of this technique in testing a ternary polymer blend is shown in design 11.

    Temperature dependence of PET viscoelastic properties – (left) compel curve for polyethylene terephthalate (PET). A 3 second hold segment of constant compel was applied between the compel loading and unloading cycles. (center) Creep curves of indentation versus time during the compel curve hold interval. The curves occupy been normalized to vary between zero and one, highlighting the enlarge in relaxation time with temperature. (right) Temperature dependence of instantaneous modulus E1 (pink squares) and long term modulus E2 (black diamonds) obtained by fitting the creep curve to a three-element Maxwell-Voigt model (inset, center). Both E1 and E2 exhibit a dramatic drop in the temperature compass between the glass-to-rubber transition temperature Tg ≈ 77 °C and the PET crystallization temperature Tc ≈ 13 5°C due to the film’s semicrystalline nature in this range. Acquired with the MFP-3D AFM and PolyHeater sample stage. Adapted from Ref. 8.

    Figure 8: Temperature dependence of PET viscoelastic properties – (left) compel curve for polyethylene terephthalate (PET). A 3 second hold segment of constant compel was applied between the compel loading and unloading cycles. (center) Creep curves of indentation versus time during the compel curve hold interval. The curves occupy been normalized to vary between zero and one, highlighting the enlarge in relaxation time with temperature. (right) Temperature dependence of instantaneous modulus E1 (pink squares) and long term modulus E2 (black diamonds) obtained by fitting the creep curve to a three-element Maxwell-Voigt model (inset, center). Both E1 and E2 exhibit a dramatic drop in the temperature compass between the glass-to-rubber transition temperature Tg ≈ 77 °C and the PET crystallization temperature Tc ≈ 13 5°C due to the film’s semicrystalline nature in this range. Acquired with the MFP-3D AFM and PolyHeater sample stage. Adapted from Ref. 8.

    Annealing of shape remembrance polymer – Tapping mode topography images of a polystyrene (PS) microparticle during annealing. Scan size 12 μm, Z (height) scale 1.4 μm. The PS particle was flattened with a high-temperature, high-pressure nanoimprint lithography (NIL) process and then thinly coated with gold. Imaging began with the particle heated to 80°C. The heater temperature was rapidly increased to 102°C and then increased stepwise, so that it was 106°C after 78 min. and 110°C at 170 min. During annealing the particle diameter decreases and the height increases, recovering the original, pre-NIL spherical shape. A surface wrinkling morphology develops that gives information on recovery dynamics and strain energy release. Applications for micro- and nanoscale polymer particles involve drug delivery and electronic packaging; incorporating shape remembrance effects could lead to many more. Imaged with the MFP-3D AFM. Adapted from Ref. 9.

    Figure 9: Annealing of shape remembrance polymer – Tapping mode topography images of a polystyrene (PS) microparticle during annealing. Scan size 12 μm, Z (height) scale 1.4 μm. The PS particle was flattened with a high-temperature, high-pressure nanoimprint lithography (NIL) process and then thinly coated with gold. Imaging began with the particle heated to 80°C. The heater temperature was rapidly increased to 102°C and then increased stepwise, so that it was 106°C after 78 min. and 110°C at 170 min. During annealing the particle diameter decreases and the height increases, recovering the original, pre-NIL spherical shape. A surface wrinkling morphology develops that gives information on recovery dynamics and strain energy release. Applications for micro- and nanoscale polymer particles involve drug delivery and electronic packaging; incorporating shape remembrance effects could lead to many more. Imaged with the MFP-3D AFM. Adapted from Ref. 9.

    SThM on PP-PS-PE ternary blend – The sample contained 60% polypropylene (PP), 20% polystyrene (PS), and 20% polyethylene (PE) by weight. In this SThM image, the three components are clearly distinguished, with darker colors corresponding to higher thermal conductivity. As expected from literature values for their thermal conductivity, the oblong regions of PS are brightest (yellow, 0.03 W / m•K), the circular regions of PE are darkest (purple, 0.4 W / m•K), and the surrounding PP matrix is intermediate (orange, 0.12 W / m•K).Imaged with the MFP-3D AFM; scan size 15 μm. Sample courtesy of Dalia Yablon and Andy Tsou, Corporate Strategic Research, ExxonMobil Research and Engineering.

    Figure 10: SThM on PP-PS-PE ternary blend – The sample contained 60% polypropylene (PP), 20% polystyrene (PS), and 20% polyethylene (PE) by weight. In this SThM image, the three components are clearly distinguished, with darker colors corresponding to higher thermal conductivity. As expected from literature values for their thermal conductivity, the oblong regions of PS are brightest (yellow, 0.03 W / m•K), the circular regions of PE are darkest (purple, 0.4 W / m•K), and the surrounding PP matrix is intermediate (orange, 0.12 W / m•K).Imaged with the MFP-3D AFM; scan size 15 μm. Sample courtesy of Dalia Yablon and Andy Tsou, Corporate Strategic Research, ExxonMobil Research and Engineering.

    LTA of PP-PE-PS ternary blend – (top) AM-FM Viscoelastic Mapping Mode image of the selfsame sample used in design 10. The brighter colors indicate higher modulus. Scan size 6 μm. The black dots indicate points where LTA measurements were made. (bottom) The LTA measurements are color coded with the points in the image and clearly distinguish the different transition temperatures for PS (blue), PE (green) and PP (red). Sample courtesy of Dalia Yablon and Andy Tsou, Corporate Strategic Research, ExxonMobil Research and Engineering.

    Figure 11: LTA of PP-PE-PS ternary blend – (top) AM-FM Viscoelastic Mapping Mode image of the selfsame sample used in design 10. The brighter colors indicate higher modulus. Scan size 6 μm. The black dots indicate points where LTA measurements were made. (bottom) The LTA measurements are color coded with the points in the image and clearly distinguish the different transition temperatures for PS (blue), PE (green) and PP (red). Sample courtesy of Dalia Yablon and Andy Tsou, Corporate Strategic Research, ExxonMobil Research and Engineering.

    Asylum AFMs for Thermal Measurements
  • All MFP-3D AFMs except for OriginTM are compatible for the PolyHeater (from ambient temperatures to 300°C), PolyHeater+ (from ambient temperatures to 400°C), and CoolerHeater (from -30°C to +120°C) sample stages. These operate in harmony with the Environmental Controller to achieve a closed-loop control for the temperature which is fully programmable.
  • Cypher ES AFMs occupy a Heater (temperatures from ambient to 250°C) and CoolerHeater (0°C to 120°C) sample stages. These accurately regulate temperature without the requisite for external controllers or other electronic components, or for cooling pumps.
  • All MFP-3D family AFMs Use state-of-the-art microfabricated silicon probes with the SThM probe holder to achieve SThM temperature and thermal conductivity measurements with higher resolution than Wollaston-wire probes.
  • The Zither™ Modulated Thermal Analysis Option available with Cypher and MFP-3D family AFMs (except Origin) allows LTA to achieve a better than 20 nm lateral resolution. The Use of proprietary calibration and measurement protocols develop the results extremely sensitive but avert the circumstance of artifacts enjoy those produced by thermal drift.
  • Monitoring Dynamic Processes due to Solvent and Thermal Effects

    In an environment that is not at leeway temperature, the change in morphology and physical properties over time must exist understood. When a polymer interacts with a liquid or vapor solvent, the durability and performance of the polymer over the long term can fade down. In other applications, the rise in temperature can move the lifetime or dependability of the device.

    Once the solvent concentration or thermal gradients are controlled, the more advanced AFMs such as the Cypher occupy rapid scan rates to monitor dynamic behavior directly, such as degradation or decomposition, chain and brush ordering, formation of lamellae, crystallization and melting. It is feasible to obtain movies showing the mechanical or topographical properties if the frame rate is below one minute. In design 12, one such instance is seen where the changes in morphology occur when a melted polymer recrystallizes.

    It is often difficult to operate in tapping mode using solvents or other liquids due to the multiple resonance peaks occurring as a result of mechanical coupling between the tapping piezo and the fluid. This has been countered using different techniques using various actuation platforms. That is, actuation by photothermal, electromagnetic or other forces that brings the multiple peaks down to a few, making it easier to Use tapping mode with more stable results.

    Recrystallization of PP – A blend of polystyrene (PS) and polypropylene (PP) was heated to 140°C to deliquesce the syndiotactic PP and then cooled at a constant rate while imaging at one frame per minute. As the sample cools, the continuous PP angle first nucleates and then forms partly ordered, semicrystalline regions. Some of the regions form on top of the PS spherical domains. Imaged with the Cypher ES AFM; scan size 4 μm.

    Figure 12: Recrystallization of PP – A blend of polystyrene (PS) and polypropylene (PP) was heated to 140°C to deliquesce the syndiotactic PP and then cooled at a constant rate while imaging at one frame per minute. As the sample cools, the continuous PP angle first nucleates and then forms partly ordered, semicrystalline regions. Some of the regions form on top of the PS spherical domains. Imaged with the Cypher ES AFM; scan size 4 μm.

    Analyzing Electrical and Functional Behavior

    Polymers occupy unique characteristics and can exist manufactured at low costs, rendering them very appealing for a host of applications enjoy resilient electronics, photovoltaics using organic sources, organic LEDs, MEMS actuators and sensors, and data storage devices. At nanoscale, the electrical and mechanical properties of these materials must exist well understood, and this becomes more vital as miniaturization of devices proceeds. One particularly essential area is finding the correlation between any local heterogeneities and the bulk performance.

    There are specialized modes of AFM operation to examine the electrical and electromechanical behavior of nanoscale of polymers which occupy conductive, semiconducting and dielectric properties. Some of these modes are conductive AFM (CAFM), electric compel microscopy (EFM), and Kelvin probe compel microscopy (KPFM). These yield electrical data on conductivity, surface potential, photocurrents and work function.

    When piezoelectric and ferroelectric polymers are being tested, piezoresponse compel microscopy (PFM) is used to resolve electromechanical behavior at nanoscale, such as polarization switching and domain growth. design 13 shows how PFM is useful in bringing out fine detail on ferroelectric polymer nanomesas.

    Time-dependent domain switching of PVDF-TrFE – (a) Topography and (b) PFM angle images of as-grown polyvinylidene fluoride-trifluoroethylene (PVDF-TrFE) nanomesa. Scan size 600 nm, Z scale 30 nm (height) and 15° (PFM phase; minimum blue, maximum yellow). (c) PFM angle image of the selfsame nanomesa after global switching due to a DC warp of +6 V. (d-f) Time-dependent polarization orientation switching from an applied voltage pulse of -5 V after (d) 1 s, (e) 4 s, and (f) 8 s. The approximate tip position is indicated by the black dot in (a). The lofty electromechanical activity of PVDF-TrFe makes it attractive in many transducer and sensor applications. Imaged with the MFP-3D AFM. Adapted from Ref. 10.

    Figure 13: Time-dependent domain switching of PVDF-TrFE – (a) Topography and (b) PFM angle images of as-grown polyvinylidene fluoride-trifluoroethylene (PVDF-TrFE) nanomesa. Scan size 600 nm, Z scale 30 nm (height) and 15° (PFM phase; minimum blue, maximum yellow). (c) PFM angle image of the selfsame nanomesa after global switching due to a DC warp of +6 V. (d-f) Time-dependent polarization orientation switching from an applied voltage pulse of -5 V after (d) 1 s, (e) 4 s, and (f) 8 s. The approximate tip position is indicated by the black dot in (a). The lofty electromechanical activity of PVDF-TrFe makes it attractive in many transducer and sensor applications. Imaged with the MFP-3D AFM. Adapted from Ref. 10.

    Asylum AFMs for Examining Functional Behavior
  • The ORCATM is a module in Cypher S and MFP-3D AFMs which allows current measurement at sensitive scales for CAFM. It can too develop Use of an optional amplifier which has low-noise and dual-gain properties, to allow measurements to exist taken at lofty sensitivity over a compass of under 1 pA to 10 µA.
  • NanoTDDBTM is another unique Asylum mode for time-dependent dielectric breakdown assessment at smaller scales than can exist achieved using conventional probes. Here, the tip-sample voltage is kept constant or increased in steps to 220 V until the detection of a breakdown event.
  • Asylum has the only commercially available high-voltage PFM mode that can manipulate up to 220 V for Use by the MFP-3D AFM and the Cypher family AFMs. impeccable AFMs from Asylum occupy integrated software that offers very sensitive PFM measurements, with the Dual ACTM Resonance Tracking (DARTTM) which has been patented by Asylum, or the unique troupe Excitation option.
  • Increase Output with Asylum AFMs

    This article provides a number of examples to intricate how powerful the Use of Asylum AFMs can exist in analyzing polymers, whether for scientific or engineering purposes. Newer developments occupy made AFMs able to acquire images to visualize a number of different physical properties and behavior as well as morphology. Asylum AFMs incorporate many remarkable functionalities, such as lofty spatial resolution, rapid scanning, several operating modes, and so on, which will enable many more characterizations of polymers.

    References
  • P. Samori, M. Surin, V. Palermo, R. Lazzaroni, and  P. Leclere, Phys. Chem. Chem. Phys. 8, 3927 (2006).
  • L.  Sawyer, D. Grubb, and G. Meyer, Polymer Microscopy, 3rd Edition (Springer, original York, 2008).
  • M.E.  McConney, S.  Singamaneni, and V.V.  Tsukruk,  Polym.  Rev.  50, 235 (2010).
  • H.  Schönherr and G.J.  Vancso, Scanning  compel Microscopy of Polymers  (Springer  Laboratory,  Heidelberg,  2010).
  • N.T.  Lawrence, J.M.  Kehoe, D.B.  Hoffman, C.  Marks,    J.M.  Yarbrough, G.M.  Atkinson, R.A.  Register, M.J. Fasolka, and M.L. Trawick,  Macromol.  Rapid Comm.31, 1003 (2010).
  • T.  Gkourmpis, C.  Svanberg, S.K.  Kaliappan, W. Schaffer,   M.  Obadal, G.  Kandioller, and D.  Tranchida, Eur. Polym.  J.    49, 1975 (2013).
  • S.  Kienle, T. Pirzer, S.  Krysiak, M Geisler, and T. Hugel, Faraday Discuss.160, 329  (2013).
  • C.A.  Grant, A. Alfouzan, T. Gough, P.C. Twigg and P.D. Coates, Micron 44, 174 (2013).
  • L.M.  Cox, J.P.  Killgore, Z.  Li, Z.  Zhang, D.C.  Hurley, J. Xiao, and Y. Ding, Adv.  Mater.  26, 899 (2013).
  • P.  Sharma, T.J. Reece, S.  Ducharme, and A. Gruverman, Nano  Lett.11,  1970  (2011).
  • This information has been sourced, reviewed and adapted from materials provided by Asylum Research - An Oxford Instruments Company.

    For more information on this source, gratify visit Asylum Research - An Oxford Instruments Company.


    Seeking Computer Engineer/Electronics Engineer/Computer Scientist in Multiple Locations – Department of the Army | killexams.com actual questions and Pass4sure dumps

    The United States government is a massive employer, and is always looking for qualified candidates to fill a wide variety of open employment positions in locations across the country. Below you’ll find a Qualification Summary for an active, open job listing from the Department of the Army. The opening is for a Computer Engineer/Electronics Engineer/Computer Scientist in Multiple Locations Feel free to browse this and any other job listings and attain out to us with any questions!

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    Computer Engineer/Electronics Engineer/Computer Scientist – Multiple LocationsU.S. Army Cyber Command, Department of the ArmyJob ID: 1744Start Date: 04/11/2018End Date: 12/31/2018

    Qualification SummaryWho May Apply: US CitizensIn order to qualify, you must meet the education and/or requirements described below. suffer refers to paid and unpaid experience, including volunteer work done through National Service programs (e.g., Peace Corps, AmeriCorps) and other organizations (e.g., professional; philanthropic; religious; spiritual; community; student; social). You will receive credit for impeccable qualifying experience, including volunteer experience. Your resume must clearly report your relevant experience; if qualifying based on education, your transcripts will exist required as fragment of your application. Additional information about transcripts is in this document. Basic Requirement for Computer/Electronics Engineer (continued):2. Written Test – Evidence of having successfully passed the Fundamentals of Engineering examination, or any other written test required for professional registration, by an engineering licensure board in the various States, the District of Columbia, Guam, or Puerto Rico.3. Specified academic courses – Successful completion of at least 60 semester hours of courses in the physical, mathematical, and engineering sciences and that included the courses specified in A above. The courses must exist fully acceptable toward meeting the requirements of an engineering program.4. Related curriculum – Successful completion of a curriculum leading to a bachelor’s degree in an usurp scientific field, e.g., engineering technology, physics, chemistry, architecture, computer science, mathematics, hydrology, or geology, may exist accepted in lieu of a degree in engineering, provided the applicant has had at least 1 year of professional engineering suffer acquired under professional engineering supervision and guidance. Ordinarily there should exist either an established purpose of intensive training to develop professional engineering competence, or several years of prior professional engineering-type experience, e.g., in interdisciplinary positions. Basic Requirement for Computer Scientist:Degree: Bachelor’s degree (or higher degree) in computer science or bachelor’s degree (or higher degree) with 30 semester hours in a combination of mathematics, statistics, and computer science. At least 15 of the 30 semester hours must occupy included any combination of statistics and mathematics that included differential and integral calculus. Meeting the Basic Requirements for either the Computer/Electronics Engineer or Computer Scientist is qualifying for the GS-05 level. In addition to meeting the basic requirement above, to qualify for this position at the GS-07 or above, you must too meet the qualification requirements listed below: GS-07:Specialized Experience: One year of specialized suffer which includes applying basic formulas to routine calculations; preparing graphs, or tables for others; and assisting with field inspections or data gathering. This definition of specialized suffer is typical of work performed at the next lower grade/level position in the federal service (GS-05).OREducation: One plenary year of graduate smooth education in a field which demonstrates the knowledge, skills, and abilities necessary to achieve the work of the position, such as: Engineering or Computer Science.ORSuperior Academic Achievement. In order to exist creditable under this provision, Superior Academic Achievement must occupy been gained in a curriculum that is qualifying for the position to exist filled, such as that identified in Education above. Superior Academic Achievement is based on: (1) Class Standing – Applicants must exist in the upper third of the graduating class in the college, university, or major subdivision, such as the College of freehanded Arts or the School of trade Administration, based on completed courses; OR(2) Grade-Point average – Applicants must occupy a grade-point average of either (a) 3.0 or higher out of a feasible 4.0 (“B” or better) as recorded on your official transcript, or as computed based on 4 years of education, or as computed based on courses completed during the final 2 years of the curriculum; or (b) 3.5 or higher out of a feasible 4.0 (“B+” or better) based on the average of the required courses completed in the major field or the required courses in the major field completed during the final 2 years of the curriculum.; OR(3) veneration Society Membership – Applicants may exist considered eligible based on membership in one of the approved national scholastic veneration societies listed by the Association of College veneration Societies (https://www.achsnatl.org/).ORCombination of Education and Experience: A combination of education and suffer may exist used to qualify for this position as long as the computed percentage of the requirements is at least 100%. To compute the percentage of the requirements, divide your total months of suffer by 12. Then divide the total number of completed graduate semester hours (or equivalent) by 18. Add the two percentages. GS-09:Specialized Experience: One year of specialized suffer which includes reviewing technical aspects of applications, statistical data, designs or proposed plans for compliance. This definition of specialized suffer is typical of work performed at the next lower grade/level position in the federal service (GS-07). OREducation: Master’s or equivalent graduate degree or 2 plenary years of progressively higher smooth graduate education leading to such a degree in a field which demonstrates the knowledge, skills, and abilities necessary to achieve the work of the position, such as: Engineering or Computer Science.ORCombination of Education and Experience: A combination of education and suffer may exist used to qualify for this position as long as the computed percentage of the requirements is at least 100%. To compute the percentage of the requirements, divide your total months of suffer by 12. Then divide the total number of completed graduate semester hours (or equivalent) beyond the first year (total graduate semester hours minus 18) by 18. Add the two percentages. GS-11:Specialized Experience: One year of specialized suffer which includes reviewing technical aspects of applications, designs or proposed plans; and performing administrative duties such as reviewing, coordinating and monitoring implementation of policies, and conducting analysis of data to support conclusion or recommendations. This definition of specialized suffer is typical of work performed at the next lower grade/level position in the federal service (GS-09).OREducation: Ph.D. or equivalent doctoral degree or 3 plenary years of progressively higher smooth graduate education leading to such a degree in a field which demonstrates the knowledge, skills, and abilities necessary to achieve the work of the position, such as: Engineering or Computer Science.ORCombination of Education and Experience: A combination of education and suffer may exist used to qualify for this position as long as the computed percentage of the requirements is at least 100%. To compute the percentage of the requirements, divide your total months of suffer by 12. Then divide the total number of completed graduate semester hours (or equivalent) beyond the second year (total graduate semester hours minus 36) by 18. Add the two percentages. GS-12:Specialized Experience: One year of specialized suffer which includes planning and conducting technical integration of projects; analyzing project requirements; implementing plans; preparing contractual documentation or reports; and providing technical guidance. This definition of specialized suffer is typical of work performed at the next lower grade/level position in the federal service (GS-11).Some federal jobs allow you to substitute your education for the required suffer in order to qualify. For the GS-12 grade level, you must meet the qualification requirement using suffer alone–no substitution of education for suffer is permitted.

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